Mettler-Toledo Product Inspection has introduced the X56 DXD+, a dual energy photon-counting x-ray inspection system designed to help food manufacturers detect difficult-to-find contaminants in packaged products.
The launch expands the company’s X6 Series portfolio and reflects growing demand for advanced inspection technologies capable of addressing increasingly complex food safety and quality-control challenges.
The X56 DXD+ is aimed at medium and large packaged products running on single-lane production lines, as well as smaller packages processed across multiple lanes. The system is designed to identify low-density contaminants, including rubber and plastic, which can be difficult to detect using conventional inspection methods. Such capabilities are particularly relevant for manufacturers producing products such as pet food, crisps and potatoes, where variations in product density and packaging formats can complicate inspection processes.
The addition of the X56 DXD+ broadens the X6 Series, which now covers applications ranging from individual retail packs to larger cases and multi-packs. The new system builds on the company’s existing X16 and X36.2 platforms while introducing dual energy photon-counting technology within a 500mm-wide inspection system.
Artificial intelligence plays a central role in the new platform. According to the company, AI-enabled inspection functions can improve the accuracy and consistency of quality-control processes while reducing unnecessary product rejection. The technology is designed to address inspection challenges associated with overlapping or mixed products, helping manufacturers improve production efficiency. Mettler-Toledo said the AI capabilities are also available across other x-ray systems in its portfolio.
The X56 DXD+ combines DXD+ detector technology with Advanced Material Discrimination Pro software, enabling the system to distinguish contaminants in products that exhibit significant variation in thickness, density or texture. The technology is intended to improve detection performance in applications where traditional single-energy x-ray systems may struggle, including multi-packs, bags of crisps and larger carton-based products.
The company positions the X56 DXD+ alongside the X16, which is designed for high-speed inspection of individual packages, and the X36.2, which targets more advanced and higher-throughput production environments, including multi-lane operations.
Operational efficiency was also a focus during development. The system incorporates an intuitive user interface, tool-free belt removal for faster cleaning and a hygienic design intended for high-volume manufacturing environments. Mettler-Toledo said the X56 DXD+ can process up to 500 products per minute, allowing manufacturers to maintain throughput while addressing rising operational costs.
Beyond contaminant detection, the system includes a range of quality-control tools such as completeness checks, clip detection and inspections designed to identify products trapped within package seals. These functions are intended to improve consistency and protect brand reputation by identifying defects before products leave the production line.
The X56 DXD+ has been developed for global deployment and can be configured with a range of conveyor heights, reject mechanisms and single- or multi-lane layouts. The system also includes traceability features through a recorded image database that can be accessed directly or integrated with Mettler-Toledo ProdX data management software for centralized monitoring and compliance management.
According to the company, the connectivity features support real-time monitoring, secure record-keeping and audit readiness across production facilities. ProdX automates the collection, monitoring and reporting of inspection data, helping manufacturers meet regulatory requirements while providing documentation of due diligence and operational performance.
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